Yoichi Miyahara

Dr. Yoichi Miyahara joined the department of physics, Texas State University in January, 2019 as an assistant professor. He is an experimental physicist with electrical and mechanical engineering background. He obtained his Ph.D. in electrical engineering at Waseda University in Tokyo where he worked on the synthesis and tunneling spectroscopy/scanning tunneling microscopy of various transition metal dichalcogenides. He then worked in the department of microengineering at École Polytechnique Fédérale de Lausanne (EPFL) in Switzerland as a research staff where he developed atomic force microscopes which was specifically designed for nanometer scale metrological dimensional measurements. During that period, he was exposed to various aspects of mechatronics instrumentation ranging from optical interferometry to active magnetic control. After he joined the department of physics at McGill University in Montreal as a research associate, he started to work on the development and applications of advanced scanning probe microscopy techniques that are geared toward material property characterization in nanometer scale such as quantum dots, nanoparticles, nanowires and novel energy materials. His research group is currently working on developing new spectroscopic material characterization techniques with nanometer scale spatial resolution based on mechanical detection of relevant signals such as mechanically detected vibrational spectroscopy and electrometry with ultra-high sensitivity.