Dr. Jiechao Jiang is a Professor of Research in the Department of Materials Science and Engineering and the facility manager of the UTA Characterization Center for Materials and Biology (CCMB). Dr. Jiang received his Ph.D. in 1992 from the University of Science and Technology Beijing. Before joining UTA, he has worked at Louisiana State University, University of Michigan (Ann Arbor), University of Marburg & Max-Planck-Institute (Germany), and Stockholm University (Sweden). Dr. Jiang has thirty years’ experience in the field of electron microscopy and microanalysis. He has extensive expertise of most electron microscope techniques and tremendous experience in surface analysis. Dr. Jiang has published about 180 referred journal articles on the advance materials including semiconductor and ceramic oxide thin films, surface modified materials and coatings, nanostructured materials, minerals and quasicrystals which have been cited by other authors more than 4390 times (h-index: 36; i10index: 88). Dr. Jiang‘s research projects have been funded by NSF.
Research Description
•Analytical TEM, High Resolution TEM, STEM, in-situ TEM, SEM, XPS/Auger, electron Diffraction, electron crystallographic image processing and image simulation
•Microstructures and defects of advanced functional materials.
•Atomistic structure of multi-layer and film/substrate interfaces of epitaxial thin films.
•Self-assembled nanostructures for nano-electronic and opto-electric devices, and nano fuel cells.
•Processing, microstructures, and property relationships in micro/nano-scale materials (thin films, coatings, surface layers and nanomaterials).
•Nucleation, growth mechanisms, interface structures and surface morphologies, structural modeling and simulation of epitaxial thin films.
•Materials Characterization using AFM, TEM, HRTEM, SEM, XRD, Auger, XPS, and DSC, etc.